Repositorio Institucional de la Universidad de Oviedo

Mostrando ítems 1-8 de 8

Common-path two-wavelength interferometer with sub-micron precision for profile measurements in on-line applications

Enguita González, José María; Álvarez García, Ignacio; Frade Rodríguez, María; Marina Juárez, Jorge (2009)
Common-path two-wavelength interferometer with submicron precision for profile measurements in on-line applications

Enguita González, José María; Álvarez García, Ignacio; Frade Rodríguez, María; Marina Juárez, Jorge (2010)
Fringe pattern characterization by OPD analysis in a lateral shearing interferometric profilometer

Frade Rodríguez, María; Enguita González, José María; Álvarez García, Ignacio; Rodríguez Jiménez, Silvia (2011)
In situ 3D profilometry of rough objects with a lateral shearing interferometry range finder

Frade Rodríguez, María; Enguita González, José María; Álvarez García, Ignacio (2012)
In-Situ Waviness Characterization of Metal Plates by a Lateral Shearing Interferometric Profilometer

Frade Rodríguez, María; Enguita González, José María; Álvarez García, Ignacio (2013)
On-line metrology with conoscopic holography: Beyond triangulation

Álvarez García, Ignacio; Enguita González, José María; Frade Rodríguez, María; Marina Juárez, Jorge; Ojea Merín, Guillermo (MDPI, 2009)
Técnicas avanzadas de perfilometría óptica in-situ basada en interferometría de desplazamiento lateral para medidas submicrométricas

Frade Rodríguez, María (Universidad de Oviedo, 2012-10-26)
Toward extended range sub-micron Conoscopic Holography profilometers, using multiple wavelengths and phase measurement

Enguita González, José María; Álvarez García, Ignacio; Marina Juárez, Jorge; Ojea Merín, Guillermo; Cancelas Caso, José Antonio; Frade Rodríguez, María (2009)