In-Situ Waviness Characterization of Metal Plates by a Lateral Shearing Interferometric Profilometer
Publication date:
2013
Publisher version:
Citación:
Sensors, 13(4), p. 4906-4921 (2013); doi:10.3390/s130404906
Descripción física:
p. 4906-4921
ISSN:
Identificador local:
20130493