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In-Situ Waviness Characterization of Metal Plates by a Lateral Shearing Interferometric Profilometer

dc.contributor.authorFrade Rodríguez, María 
dc.contributor.authorEnguita González, José María 
dc.contributor.authorÁlvarez García, Ignacio 
dc.date.accessioned2013-08-27T09:58:13Z
dc.date.available2013-08-27T09:58:13Z
dc.date.issued2013
dc.identifier.citationSensors, 13(4), p. 4906-4921 (2013); doi:10.3390/s130404906
dc.identifier.issn1424-8220
dc.identifier.urihttp://hdl.handle.net/10651/18773
dc.format.extentp. 4906-4921
dc.language.isoeng
dc.relation.ispartofSensors
dc.rights© M. Frade Rodríguez et al., con licencia de Molecular Diversity Preservation International, Basilea, Suiza
dc.rightsCC Reconocimiento - No comercial - Sin obras derivadas 3.0 España
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/3.0/es/
dc.titleIn-Situ Waviness Characterization of Metal Plates by a Lateral Shearing Interferometric Profilometer
dc.typejournal article
dc.identifier.local20130493
dc.identifier.doi10.3390/s130404906
dc.relation.publisherversionhttp://dx.doi.org/10.3390/s130404906
dc.rights.accessRightsopen access


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© M. Frade Rodríguez et al., con licencia de Molecular Diversity Preservation International, Basilea, Suiza
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