Repositorio Institucional de la Universidad de Oviedo

Fringe pattern characterization by OPD analysis in a lateral shearing interferometric profilometer

Author:

Frade Rodríguez, María; Enguita González, José María; Álvarez García, Ignacio; Rodríguez Jiménez, Silvia

Publication date:

2011

Publisher version:

http://dx.doi.org/10.1117/12.889267

Citación:

Optical Measurement Systems for Industrial Inspection Vii, 8082, (2011); doi:10.1117/12.889267

URI:

http://hdl.handle.net/10651/11104

ISSN:

0277-786X

Identificador local:

20111517

DOI:

10.1117/12.889267