Surface x-ray diffraction analysis using a genetic algorithm: The case of Sn/Cu(100)-(3v2 × v2)R45°
Publication date:
2009
Publisher version:
Citación:
Journal of Physics Condensed Matter, 21(13), (2009); doi:10.1088/0953-8984/21/13/134011
ISSN:
Identificador local:
20090591
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