Surface x-ray diffraction analysis using a genetic algorithm: The case of Sn/Cu(100)-(3v2 × v2)R45°

dc.contributor.author	Martínez Blanco, David
dc.contributor.author	Joco, Victor
dc.contributor.author	Quirós Fernández, Carlos
dc.contributor.author	Segovia Cabrero, Pilar
dc.contributor.author	García Michel, Enrique
dc.date.accessioned	2013-01-30T10:10:54Z
dc.date.available	2013-01-30T10:10:54Z
dc.date.issued	2009
dc.identifier.citation	Journal of Physics Condensed Matter, 21(13), (2009); doi:10.1088/0953-8984/21/13/134011	spa
dc.identifier.issn	0953-8984
dc.identifier.uri	http://hdl.handle.net/10651/8979
dc.language.iso	eng
dc.relation.ispartof	Journal of Physics Condensed Matter	spa
dc.rights	(c) Journal of Physics Condensed Matter
dc.source	SCOPUS	spa
dc.source.uri	http://www.scopus.com/inward/record.url?eid=2-s2.0-65449118800&partnerID=40
dc.title	Surface x-ray diffraction analysis using a genetic algorithm: The case of Sn/Cu(100)-(3v2 × v2)R45°	spa
dc.type	journal article
dc.identifier.local	20090591	spa
dc.identifier.doi	10.1088/0953-8984/21/13/134011
dc.relation.publisherversion	http://dx.doi.org/10.1088/0953-8984/21/13/134011	spa

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