Repositorio Institucional de la Universidad de Oviedo

Common-path two-wavelength interferometer with submicron precision for profile measurements in on-line applications

Author:

Enguita González, José María; Álvarez García, Ignacio; Frade Rodríguez, María; Marina Juárez, Jorge

Publication date:

2010

Publisher version:

http://dx.doi.org/10.1117/1.3321709

Citación:

Optical Engineering, 49(2), (2010); doi:10.1117/1.3321709

URI:

http://hdl.handle.net/10651/5822

ISSN:

1094-4087

Identificador local:

20100489

DOI:

10.1117/1.3321709