| dc.contributor.author | Enguita González, José María | |
| dc.contributor.author | Álvarez García, Ignacio | |
| dc.contributor.author | Frade Rodríguez, María | |
| dc.contributor.author | Marina Juárez, Jorge | |
| dc.date.accessioned | 2013-01-30T09:55:46Z | |
| dc.date.available | 2013-01-30T09:55:46Z | |
| dc.date.issued | 2010 | |
| dc.identifier.citation | Optical Engineering, 49(2), (2010); doi:10.1117/1.3321709 | spa |
| dc.identifier.issn | 1094-4087 | |
| dc.identifier.uri | http://hdl.handle.net/10651/5822 | |
| dc.language.iso | eng | |
| dc.relation.ispartof | Optical Engineering | spa |
| dc.source | WOK | spa |
| dc.title | Common-path two-wavelength interferometer with submicron precision for profile measurements in on-line applications | spa |
| dc.type | journal article | |
| dc.identifier.local | 20100489 | spa |
| dc.identifier.doi | 10.1117/1.3321709 | |
| dc.relation.publisherversion | http://dx.doi.org/10.1117/1.3321709 | spa |
