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Surface Defect System for Long Product Manufacturing Using Differential Topographic Images

dc.contributor.authorCalle Herrero, Francisco Javier de la 
dc.contributor.authorGarcía Martínez, Daniel Fernando 
dc.contributor.authorUsamentiaga Fernández, Rubén 
dc.date.accessioned2020-09-24T07:44:00Z
dc.date.available2020-09-24T07:44:00Z
dc.date.issued2020
dc.identifier.citationSensors, 20(7), p. 2142- (2020); doi:10.3390/s20072142
dc.identifier.urihttp://hdl.handle.net/10651/56595
dc.description.sponsorshipThis work has been partially funded by the project RTI2018-094849-B-I00 of the Spanish Research Planoriented to Societal Challenges.
dc.format.extentp. 2142-
dc.language.isoeng
dc.relation.ispartofSensors
dc.rights© 2020 Calle Herrero et al.
dc.rightsCC Reconocimiento 4.0 Internacional
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/
dc.sourceWOS:000537110500338
dc.titleSurface Defect System for Long Product Manufacturing Using Differential Topographic Images
dc.typejournal article
dc.identifier.doi10.3390/s20072142
dc.relation.projectIDRTI2018-094849-B-I00
dc.relation.publisherversionhttp://dx.doi.org/10.3390/s20072142
dc.rights.accessRightsopen access
dc.type.hasVersionVoR


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