Surface Defect System for Long Product Manufacturing Using Differential Topographic Images

dc.contributor.author	Calle Herrero, Francisco Javier de la
dc.contributor.author	García Martínez, Daniel Fernando
dc.contributor.author	Usamentiaga Fernández, Rubén
dc.date.accessioned	2020-09-24T07:44:00Z
dc.date.available	2020-09-24T07:44:00Z
dc.date.issued	2020
dc.identifier.citation	Sensors, 20(7), p. 2142- (2020); doi:10.3390/s20072142
dc.identifier.uri	http://hdl.handle.net/10651/56595
dc.description.sponsorship	This work has been partially funded by the project RTI2018-094849-B-I00 of the Spanish Research Planoriented to Societal Challenges.
dc.format.extent	p. 2142-
dc.language.iso	eng
dc.relation.ispartof	Sensors
dc.rights	© 2020 Calle Herrero et al.
dc.rights	CC Reconocimiento 4.0 Internacional
dc.rights.uri	http://creativecommons.org/licenses/by/4.0/
dc.source	WOS:000537110500338
dc.title	Surface Defect System for Long Product Manufacturing Using Differential Topographic Images
dc.type	journal article
dc.identifier.doi	10.3390/s20072142
dc.relation.projectID	RTI2018-094849-B-I00
dc.relation.publisherversion	http://dx.doi.org/10.3390/s20072142
dc.rights.accessRights	open access
dc.type.hasVersion	VoR

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