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Surface Defect System for Long Product Manufacturing Using Differential Topographic Images

Author:
Calle Herrero, Francisco Javier de laUniovi authority; García Martínez, Daniel FernandoUniovi authority; Usamentiaga Fernández, RubénUniovi authority
Publication date:
2020
Publisher version:
http://dx.doi.org/10.3390/s20072142
Citación:
Sensors, 20(7), p. 2142- (2020); doi:10.3390/s20072142
Descripción física:
p. 2142-
URI:
http://hdl.handle.net/10651/56595
DOI:
10.3390/s20072142
Patrocinado por:

This work has been partially funded by the project RTI2018-094849-B-I00 of the Spanish Research Planoriented to Societal Challenges.

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© 2020 Calle Herrero et al.
This item is protected with a Creative Commons License