Analytical potential of rf-PGD-TOFMS for depth profiling of an oxidized thin film composite
Publication date:
2016
Publisher version:
Citación:
Journal of Analytical Atomic Spectrometry, 31(1), p. 288-296 (2016); doi:10.1039/c5ja00104h
Descripción física:
p. 288-296
ISSN:
DOI:
Patrocinado por:
Spanish Ministry of Science [MAT2010-20921, CTQ2013-49032-C2-2 R]; Spanish Ministry of Economy and Competitiveness and Innovation; Principality of Asturias, "Plan de Ciencia, Tecnologia e innovacion" [FC-15-GRUPIN14-040]; Feder Program
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