| dc.contributor.author | González Gago, Cristina | |
| dc.contributor.author | Pisonero Castro, Jorge | |
| dc.contributor.author | Sandín, R. | |
| dc.contributor.author | Fuertes Martínez, José Félix | |
| dc.contributor.author | Sanz Medel, Alfredo | |
| dc.contributor.author | Bordel García, Nerea | |
| dc.date.accessioned | 2016-05-06T09:28:03Z | |
| dc.date.available | 2016-05-06T09:28:03Z | |
| dc.date.issued | 2016 | |
| dc.identifier.citation | Journal of Analytical Atomic Spectrometry, 31(1), p. 288-296 (2016); doi:10.1039/c5ja00104h | |
| dc.identifier.issn | 0267-9477 | |
| dc.identifier.uri | http://hdl.handle.net/10651/37071 | |
| dc.description.sponsorship | Spanish Ministry of Science [MAT2010-20921, CTQ2013-49032-C2-2 R]; Spanish Ministry of Economy and Competitiveness and Innovation; Principality of Asturias, "Plan de Ciencia, Tecnologia e innovacion" [FC-15-GRUPIN14-040]; Feder Program | |
| dc.format.extent | p. 288-296 | |
| dc.language.iso | eng | |
| dc.relation.ispartof | Journal of Analytical Atomic Spectrometry | |
| dc.rights | ©, | |
| dc.source | Scopus | |
| dc.source.uri | http://www.scopus.com/inward/record.url?eid=2-s2.0-84952887070&partnerID=40&md5=9c4ae363d18a432d023281dd4a153fea | |
| dc.title | Analytical potential of rf-PGD-TOFMS for depth profiling of an oxidized thin film composite | |
| dc.type | journal article | |
| dc.identifier.doi | 10.1039/c5ja00104h | |
| dc.relation.projectID | MAT2010-20921 | |
| dc.relation.projectID | CTQ2013-49032-C2-2 R | |
| dc.relation.projectID | FC-15-GRUPIN14-040 | |
| dc.relation.publisherversion | http://dx.doi.org/10.1039/c5ja00104h | |
