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Comparing temperature measurement using infrared line scanners and the wedge method

Author:
Usamentiaga Fernández, RubénUniovi authority; García Martínez, Daniel FernandoUniovi authority; Molleda Meré, JulioUniovi authority; González Bulnes, FranciscoUniovi authority; Pérezy, J. M.
Publication date:
2010
Publisher version:
http://dx.doi.org/10.1109/IMTC.2010.5488294
Citación:
2010 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2010 - Proceedings, p. 1256-1261 (2010); doi:10.1109/IMTC.2010.5488294
Descripción física:
p. 1256-1261
Description:

IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2010 (2010. Austin, TX)

URI:
http://www.scopus.com/inward/record.url?eid=2-s2.0-77957854593&partnerID=40&md5=7abe9c44841ae6aa9a7c2663f88a5dc8
http://hdl.handle.net/10651/36331
ISBN:
9781424428335
DOI:
10.1109/IMTC.2010.5488294
Patrocinado por:

IEEE;IEEE Instrumentation and Measurement Society (I and M);IEEE Central Texas Section

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