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Comparing temperature measurement using infrared line scanners and the wedge method

dc.contributor.authorUsamentiaga Fernández, Rubén 
dc.contributor.authorGarcía Martínez, Daniel Fernando 
dc.contributor.authorMolleda Meré, Julio 
dc.contributor.authorGonzález Bulnes, Francisco 
dc.contributor.authorPérezy, J. M.
dc.date.accessioned2016-03-22T13:16:03Z
dc.date.available2016-03-22T13:16:03Z
dc.date.issued2010
dc.identifier.citation2010 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2010 - Proceedings, p. 1256-1261 (2010); doi:10.1109/IMTC.2010.5488294
dc.identifier.isbn9781424428335
dc.identifier.urihttp://www.scopus.com/inward/record.url?eid=2-s2.0-77957854593&partnerID=40&md5=7abe9c44841ae6aa9a7c2663f88a5dc8
dc.identifier.urihttp://hdl.handle.net/10651/36331
dc.descriptionIEEE International Instrumentation and Measurement Technology Conference, I2MTC 2010 (2010. Austin, TX)
dc.description.sponsorshipIEEE;IEEE Instrumentation and Measurement Society (I and M);IEEE Central Texas Section
dc.format.extentp. 1256-1261
dc.language.isoeng
dc.relation.ispartof2010 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2010 - Proceedings
dc.rights©,
dc.sourceScopus
dc.titleComparing temperature measurement using infrared line scanners and the wedge method
dc.typeinfo:eu-repo/semantics/conferenceObject
dc.identifier.doi10.1109/IMTC.2010.5488294
dc.type.dcmitext
dc.relation.publisherversionhttp://dx.doi.org/10.1109/IMTC.2010.5488294


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