On-line submicron profile measurements from safe distances with conoscopic holography: feasibility and potential problems

dc.contributor.author	Álvarez García, Ignacio
dc.contributor.author	Enguita González, José María
dc.contributor.author	Marina Juárez, Jorge
dc.contributor.author	Fraga Bobis, César
dc.date.accessioned	2013-01-30T10:14:08Z
dc.date.available	2013-01-30T10:14:08Z
dc.date.issued	2008
dc.identifier.citation	Optical Engineering, 47(2), (2008); doi:10.1117/1.2844713	spa
dc.identifier.issn	0091-3286
dc.identifier.uri	http://hdl.handle.net/10651/9550
dc.language.iso	eng
dc.relation.ispartof	Optical Engineering	spa
dc.source	WOK	spa
dc.title	On-line submicron profile measurements from safe distances with conoscopic holography: feasibility and potential problems	spa
dc.type	journal article
dc.identifier.local	625	spa
dc.identifier.doi	10.1117/1.2844713
dc.relation.publisherversion	http://dx.doi.org/10.1117/1.2844713	spa

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