| dc.contributor.author | Álvarez García, Ignacio | |
| dc.contributor.author | Enguita González, José María | |
| dc.contributor.author | Marina Juárez, Jorge | |
| dc.contributor.author | Fraga Bobis, César | |
| dc.date.accessioned | 2013-01-30T10:14:08Z | |
| dc.date.available | 2013-01-30T10:14:08Z | |
| dc.date.issued | 2008 | |
| dc.identifier.citation | Optical Engineering, 47(2), (2008); doi:10.1117/1.2844713 | spa |
| dc.identifier.issn | 0091-3286 | |
| dc.identifier.uri | http://hdl.handle.net/10651/9550 | |
| dc.language.iso | eng | |
| dc.relation.ispartof | Optical Engineering | spa |
| dc.source | WOK | spa |
| dc.title | On-line submicron profile measurements from safe distances with conoscopic holography: feasibility and potential problems | spa |
| dc.type | journal article | |
| dc.identifier.local | 625 | spa |
| dc.identifier.doi | 10.1117/1.2844713 | |
| dc.relation.publisherversion | http://dx.doi.org/10.1117/1.2844713 | spa |
