Repositorio Institucional de la Universidad de Oviedo

Citación:

ISSN:

Patrocinado por:

The authors would like to acknowledge the Spanish Ministry of Economy and Competitiveness and the Principality of Asturias govern-ment for the financing support given to the RTI2018-096070-B-C31 and IDI/2018/000134 projects, respectively. G. Álvarez (PA-20-PF-BP19- 087) and A. Zafra (PA-18-PF-BP17-038) would also thank the Principality of Asturias for the financial support through the Severo Ochoa Scholarship Programme. Finally, the authors thank the Scientific and Technical Service, University of Oviedo, for the use of the SEM JEOL- JSM5600 scanning electron microscope.