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Polymer screening by radiofrequency glow discharge time-of-flight mass spectrometry

Author:
Lobo Revilla, LaraUniovi authority; Tuccitto, Nunzio; Bordel García, NereaUniovi authority; Pereiro García, María RosarioUniovi authority; Pisonero Castro, JorgeUniovi authority; Licciardello, Antonino; Tempez, Agnès; Chapon, Patrick; Sanz Medel, AlfredoUniovi authority
Subject:

Glow Discharge . Mass Spectrometry . Polymers . Coatings . Depth Profiles

Publication date:
2010
Publisher version:
http://dx.doi.org/10.1007/s00216-009-3367-7
Citación:
Analytical and Bioanalytical Chemistry, 396(8), p. 2863-2869 (2010); doi:10.1007/s00216-009-3367-7
Descripción física:
p. 2863-2869
Abstract:

The aim of this work is to optimise and evaluate radiofrequency glow discharge (RF GD) time-of-flight mass spectrometry (TOFMS) for identification of organic polymers. For this purpose, different polymers including poly[methylmethacrylate], poly[styrene], polyethylene terephthalate-co-isophthalate and poly[alpha-methylstyrene] have been deposited on silicon wafers and the RF GDTOFMS capabilities for qualitative identification of these polymeric layers by molecular depth profiling have been investigated. Although some molecular information using the RF continuous mode is available, the pulsed mode offers a greater analytical potential to characterise such organic coatings. Some formed polyatomic ions have proved to be useful to identify the different polymer layers, confirming that layers having similar elemental composition but different polymer structure could be also differentiated and identified.

The aim of this work is to optimise and evaluate radiofrequency glow discharge (RF GD) time-of-flight mass spectrometry (TOFMS) for identification of organic polymers. For this purpose, different polymers including poly[methylmethacrylate], poly[styrene], polyethylene terephthalate-co-isophthalate and poly[alpha-methylstyrene] have been deposited on silicon wafers and the RF GDTOFMS capabilities for qualitative identification of these polymeric layers by molecular depth profiling have been investigated. Although some molecular information using the RF continuous mode is available, the pulsed mode offers a greater analytical potential to characterise such organic coatings. Some formed polyatomic ions have proved to be useful to identify the different polymer layers, confirming that layers having similar elemental composition but different polymer structure could be also differentiated and identified.

URI:
http://hdl.handle.net/10651/5793
ISSN:
1618-2642
Identificador local:

20100673

DOI:
10.1007/s00216-009-3367-7
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