| dc.contributor.author | González Hernando, Fernando | |
| dc.contributor.author | San Sebastián, Jon | |
| dc.contributor.author | García Bediaga, Asier | |
| dc.contributor.author | Arias Pérez de Azpeitia, Manuel | |
| dc.contributor.author | Rujas, A. | |
| dc.date.accessioned | 2020-06-26T07:57:05Z | |
| dc.date.available | 2020-06-26T07:57:05Z | |
| dc.date.issued | 2019 | |
| dc.identifier.isbn | 9781728103952 | |
| dc.identifier.uri | http://hdl.handle.net/10651/55236 | |
| dc.description | Annual Energy Conversion Congress and Exposition, ECCE (11th. 2019. Baltimore, USA) | |
| dc.format.extent | p. 8911889-2962 | |
| dc.language.iso | eng | |
| dc.relation.ispartof | 2019 IEEE Energy Conversion Congress and Exposition (ECCE) | |
| dc.rights | © 2019 IEEE | |
| dc.source | Scopus | |
| dc.source.uri | https://www.scopus.com/inward/record.uri?eid=2-s2.0-85076758080&doi=10.1109%2fECCE.2019.8911889&partnerID=40&md5=03548bae317465a8d937d839e32eb8ae | |
| dc.title | Junction Temperature Model and Degradation Effect in IGBT Multichip Power Modules | |
| dc.type | conference output | spa |
| dc.identifier.doi | 10.1109/ECCE.2019.8911889 | |
| dc.relation.publisherversion | http://dx.doi.org/10.1109/ECCE.2019.8911889 | |
