Imaging techniques and scanning electron microscopy as tools for characterizing a Si-based material used in air monitoring applications

dc.contributor.author	Suárez Peña, Beatriz
dc.contributor.author	Negral Álvarez, Luis
dc.contributor.author	Castrillón Peláez, Leonor
dc.contributor.author	Megido Fernández, Laura
dc.contributor.author	Marañón Maison, María Elena
dc.contributor.author	Fernández Nava, Yolanda
dc.date.accessioned	2016-06-21T11:37:24Z
dc.date.available	2016-06-21T11:37:24Z
dc.date.issued	2016
dc.identifier.citation	Materials, 9(2), p. 109- (2016); doi:10.3390/ma9020109
dc.identifier.issn	1996-1944
dc.identifier.uri	http://hdl.handle.net/10651/37957
dc.description.sponsorship	The research leading to these results received funding from the Principality of Asturias (Spain) under Grant Agreement SV-PA-13-ECOEMP-65.
dc.format.extent	p. 109-
dc.language.iso	eng
dc.relation.ispartof	Materials, 9
dc.rights	© 2016 by the authors
dc.rights	CC Reconocimiento 4.0 Internacional
dc.rights.uri	http://creativecommons.org/licenses/by/4.0/
dc.source	Scopus
dc.source.uri	https://www.scopus.com/inward/record.uri?eid=2-s2.0-84960114737&partnerID=40&md5=2c3a317a7d14e610cd331798c77865b3
dc.title	Imaging techniques and scanning electron microscopy as tools for characterizing a Si-based material used in air monitoring applications
dc.type	journal article
dc.identifier.doi	10.3390/ma9020109
dc.relation.projectID	SV-PA-13-ECOEMP-65
dc.relation.publisherversion	http://dx.doi.org/10.3390/ma9020109
dc.rights.accessRights	open access

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