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Imaging techniques and scanning electron microscopy as tools for characterizing a Si-based material used in air monitoring applications

dc.contributor.authorSuárez Peña, Beatriz 
dc.contributor.authorNegral Álvarez, Luis 
dc.contributor.authorCastrillón Peláez, Leonor 
dc.contributor.authorMegido Fernández, Laura 
dc.contributor.authorMarañón Maison, María Elena 
dc.contributor.authorFernández Nava, Yolanda 
dc.date.accessioned2016-06-21T11:37:24Z
dc.date.available2016-06-21T11:37:24Z
dc.date.issued2016
dc.identifier.citationMaterials, 9(2), p. 109- (2016); doi:10.3390/ma9020109
dc.identifier.issn1996-1944
dc.identifier.urihttp://hdl.handle.net/10651/37957
dc.description.sponsorshipThe research leading to these results received funding from the Principality of Asturias (Spain) under Grant Agreement SV-PA-13-ECOEMP-65.
dc.format.extentp. 109-
dc.language.isoeng
dc.relation.ispartofMaterials, 9
dc.rights© 2016 by the authors
dc.rightsCC Reconocimiento 4.0 Internacional
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/
dc.sourceScopus
dc.source.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-84960114737&partnerID=40&md5=2c3a317a7d14e610cd331798c77865b3
dc.titleImaging techniques and scanning electron microscopy as tools for characterizing a Si-based material used in air monitoring applications
dc.typejournal article
dc.identifier.doi10.3390/ma9020109
dc.relation.projectIDSV-PA-13-ECOEMP-65
dc.relation.publisherversionhttp://dx.doi.org/10.3390/ma9020109
dc.rights.accessRightsopen access


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