Depth Profile Analysis of Amorphous Silicon Thin Film Solar Cells by Pulsed Radiofrequency Glow Discharge Time of Flight Mass Spectrometry

dc.contributor.author	Álvarez Toral, Aitor
dc.contributor.author	Sánchez, Pascal
dc.contributor.author	Menéndez, Armando
dc.contributor.author	Pereiro García, María Rosario
dc.contributor.author	Sanz Medel, Alfredo
dc.contributor.author	Fernández García, Beatriz
dc.date.accessioned	2015-07-13T11:28:46Z
dc.date.available	2015-07-13T11:28:46Z
dc.date.issued	2015
dc.identifier.citation	Journal of The American Society for Mass Spectrometry, 26(2), p. 305-314 (2015); doi:10.1007/s13361-014-1022-9
dc.identifier.issn	1044-0305
dc.identifier.issn	1879-1123
dc.identifier.uri	http://hdl.handle.net/10651/31624
dc.description.sponsorship	Spanish Ministry of Science and Innovation [MAT2010-20921-C02-01]; FEDER Program [MAT2010-20921-C02-01]; FPU [AP2010-3615]
dc.format.extent	p. 305-314
dc.language.iso	eng
dc.relation.ispartof	Journal of The American Society for Mass Spectrometry
dc.rights	© American Society for Mass Spectrometry
dc.title	Depth Profile Analysis of Amorphous Silicon Thin Film Solar Cells by Pulsed Radiofrequency Glow Discharge Time of Flight Mass Spectrometry
dc.type	journal article
dc.identifier.doi	10.1007/s13361-014-1022-9
dc.relation.publisherversion	http://dx.doi.org/10.1007/s13361-014-1022-9

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