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Depth Profile Analysis of Amorphous Silicon Thin Film Solar Cells by Pulsed Radiofrequency Glow Discharge Time of Flight Mass Spectrometry

Author:
Álvarez Toral, AitorUniovi authority; Sánchez, PascalUniovi authority; Menéndez, Armando; Pereiro García, María RosarioUniovi authority; Sanz Medel, AlfredoUniovi authority; Fernández García, BeatrizUniovi authority
Publication date:
2015
Publisher version:
http://dx.doi.org/10.1007/s13361-014-1022-9
Citación:
Journal of The American Society for Mass Spectrometry, 26(2), p. 305-314 (2015); doi:10.1007/s13361-014-1022-9
Descripción física:
p. 305-314
URI:
http://hdl.handle.net/10651/31624
ISSN:
1044-0305; 1879-1123
DOI:
10.1007/s13361-014-1022-9
Patrocinado por:

Spanish Ministry of Science and Innovation [MAT2010-20921-C02-01]; FEDER Program [MAT2010-20921-C02-01]; FPU [AP2010-3615]

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