| dc.contributor.author | García Martínez, Daniel Fernando | |
| dc.contributor.author | García Vázquez, Manuel | |
| dc.contributor.author | Obeso Carrera, Faustino Emilio | |
| dc.contributor.author | Fernández, Valentín | |
| dc.date.accessioned | 2015-03-09T10:16:37Z | |
| dc.date.available | 2015-03-09T10:16:37Z | |
| dc.date.issued | 2002 | |
| dc.identifier.citation | IEEE Transactions on Instrumentation and Measurement, 51(2), p. 188-195 (2002); doi:10.1109/19.997810 | |
| dc.identifier.issn | 0018-9456 | |
| dc.identifier.uri | http://hdl.handle.net/10651/30031 | |
| dc.format.extent | p. 188-195 | spa |
| dc.language.iso | eng | spa |
| dc.publisher | IEEE | |
| dc.relation.ispartof | IEEE Transactions on Instrumentation and Measurement, 51(2) | spa |
| dc.title | Flatness measurement system based on a nonlinear optical triangulation technique | spa |
| dc.type | journal article | |
| dc.identifier.doi | 10.1109/19.997810 | |
| dc.relation.publisherversion | http://dx.doi.org/10.1109/19.997810 | |
