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Flatness measurement system based on a nonlinear optical triangulation technique

Author:
García Martínez, Daniel FernandoUniovi authority; García Vázquez, ManuelUniovi authority; Obeso Carrera, Faustino EmilioUniovi authority; Fernández, Valentín
Publication date:
2002
Editorial:

IEEE

Publisher version:
http://dx.doi.org/10.1109/19.997810
Citación:
IEEE Transactions on Instrumentation and Measurement, 51(2), p. 188-195 (2002); doi:10.1109/19.997810
Descripción física:
p. 188-195
URI:
http://hdl.handle.net/10651/30031
ISSN:
0018-9456
DOI:
10.1109/19.997810
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