A path towards a better characterisation of silicon thin-film solar cells: Depth profile analysis by pulsed radiofrequency glow discharge optical emission spectrometry

dc.contributor.author	Sánchez, Pascal
dc.contributor.author	Fernández García, Beatriz
dc.contributor.author	Menéndez, Armando
dc.contributor.author	Gómez Plaza, David
dc.contributor.author	Pereiro García, María Rosario
dc.contributor.author	Sanz Medel, Alfredo
dc.date.accessioned	2013-08-27T09:58:40Z
dc.date.available	2013-08-27T09:58:40Z
dc.date.issued	2013
dc.identifier.citation	Progress in Photovoltaics: Research and Applications (2013); doi:10.1002/pip.2387
dc.identifier.issn	1062-7995
dc.identifier.issn	1099-159X
dc.identifier.uri	http://hdl.handle.net/10651/18844
dc.language.iso	eng
dc.relation.ispartof	Progress in Photovoltaics: Research and Applications
dc.source	SCOPUS
dc.title	A path towards a better characterisation of silicon thin-film solar cells: Depth profile analysis by pulsed radiofrequency glow discharge optical emission spectrometry	eng
dc.type	journal article
dc.identifier.local	20130564
dc.identifier.doi	10.1002/pip.2387
dc.relation.publisherversion	http://dx.doi.org/10.1002/pip.2387

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