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A path towards a better characterisation of silicon thin-film solar cells: Depth profile analysis by pulsed radiofrequency glow discharge optical emission spectrometry

dc.contributor.authorSánchez, Pascal 
dc.contributor.authorFernández García, Beatriz 
dc.contributor.authorMenéndez García, Alberto 
dc.contributor.authorGómez Plaza, David 
dc.contributor.authorPereiro García, María Rosario 
dc.contributor.authorSanz Medel, Alfredo 
dc.date.accessioned2013-08-27T09:58:40Z
dc.date.available2013-08-27T09:58:40Z
dc.date.issued2013
dc.identifier.citationProgress in Photovoltaics: Research and Applications (2013); doi:10.1002/pip.2387
dc.identifier.issn1062-7995
dc.identifier.issn1099-159X
dc.identifier.urihttp://hdl.handle.net/10651/18844
dc.language.isoeng
dc.relation.ispartofProgress in Photovoltaics: Research and Applications
dc.sourceSCOPUS
dc.titleA path towards a better characterisation of silicon thin-film solar cells: Depth profile analysis by pulsed radiofrequency glow discharge optical emission spectrometryeng
dc.typeinfo:eu-repo/semantics/article
dc.identifier.local20130564
dc.identifier.doi10.1002/pip.2387
dc.type.dcmitext
dc.relation.publisherversionhttp://dx.doi.org/10.1002/pip.2387


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