| dc.contributor.author | Sánchez, Pascal | |
| dc.contributor.author | Fernández García, Beatriz | |
| dc.contributor.author | Menéndez, Armando | |
| dc.contributor.author | Gómez Plaza, David | |
| dc.contributor.author | Pereiro García, María Rosario | |
| dc.contributor.author | Sanz Medel, Alfredo | |
| dc.date.accessioned | 2013-08-27T09:58:40Z | |
| dc.date.available | 2013-08-27T09:58:40Z | |
| dc.date.issued | 2013 | |
| dc.identifier.citation | Progress in Photovoltaics: Research and Applications (2013); doi:10.1002/pip.2387 | |
| dc.identifier.issn | 1062-7995 | |
| dc.identifier.issn | 1099-159X | |
| dc.identifier.uri | http://hdl.handle.net/10651/18844 | |
| dc.language.iso | eng | |
| dc.relation.ispartof | Progress in Photovoltaics: Research and Applications | |
| dc.source | SCOPUS | |
| dc.title | A path towards a better characterisation of silicon thin-film solar cells: Depth profile analysis by pulsed radiofrequency glow discharge optical emission spectrometry | eng |
| dc.type | journal article | |
| dc.identifier.local | 20130564 | |
| dc.identifier.doi | 10.1002/pip.2387 | |
| dc.relation.publisherversion | http://dx.doi.org/10.1002/pip.2387 | |
