Thickness determination of subnanometer layers using laser ablation inductively coupled plasma mass spectrometry

dc.contributor.author	Hattendorf, Bodo
dc.contributor.author	Pisonero Castro, Jorge
dc.contributor.author	Günther, Detlef
dc.contributor.author	Bordel García, Nerea
dc.date.accessioned	2013-01-30T10:23:42Z
dc.date.available	2013-01-30T10:23:42Z
dc.date.issued	2012
dc.identifier.citation	Analytical Chemistry, 84(20), p. 8771-8776 (2012); doi:10.1021/ac302137x	spa
dc.identifier.issn	0003-2700
dc.identifier.uri	http://hdl.handle.net/10651/11297
dc.format.extent	p. 8771-8776	spa
dc.language.iso	eng
dc.relation.ispartof	Analytical Chemistry	spa
dc.source	SCOPUS	spa
dc.title	Thickness determination of subnanometer layers using laser ablation inductively coupled plasma mass spectrometry	spa
dc.type	journal article
dc.identifier.local	20121504	spa
dc.identifier.doi	10.1021/ac302137x
dc.relation.publisherversion	http://dx.doi.org/10.1021/ac302137x	spa

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