Repositorio Institucional de la Universidad de Oviedo

Thickness determination of subnanometer layers using laser ablation inductively coupled plasma mass spectrometry

Author:

Hattendorf, Bodo; Pisonero Castro, Jorge; Günther, Detlef; Bordel García, Nerea

Publication date:

2012

Publisher version:

http://dx.doi.org/10.1021/ac302137x

Citación:

Analytical Chemistry, 84(20), p. 8771-8776 (2012); doi:10.1021/ac302137x

Descripción física:

p. 8771-8776

URI:

http://hdl.handle.net/10651/11297

ISSN:

0003-2700

Identificador local:

20121504

DOI:

10.1021/ac302137x