| dc.contributor.author | Frade Rodríguez, María | |
| dc.contributor.author | Enguita González, José María | |
| dc.contributor.author | Álvarez García, Ignacio | |
| dc.contributor.author | Rodríguez Jiménez, Silvia | |
| dc.date.accessioned | 2013-01-30T10:22:34Z | |
| dc.date.available | 2013-01-30T10:22:34Z | |
| dc.date.issued | 2011 | |
| dc.identifier.citation | Optical Measurement Systems for Industrial Inspection Vii, 8082, (2011); doi:10.1117/12.889267 | spa |
| dc.identifier.issn | 0277-786X | |
| dc.identifier.uri | http://hdl.handle.net/10651/11104 | |
| dc.language.iso | eng | |
| dc.relation.ispartof | Optical Measurement Systems for Industrial Inspection Vii | spa |
| dc.source | WOK | spa |
| dc.title | Fringe pattern characterization by OPD analysis in a lateral shearing interferometric profilometer | spa |
| dc.type | journal article | |
| dc.identifier.local | 20111517 | spa |
| dc.identifier.doi | 10.1117/12.889267 | |
| dc.relation.publisherversion | http://dx.doi.org/10.1117/12.889267 | spa |
