Layer contour geometric characterization in mex/p through cis-based adaptive edge detection
Publication date:
2024
Publisher version:
Citación:
Applied Sciences (Switzerland), 14(14), (2024); doi:10.3390/app14146163
ISSN:
DOI:
Patrocinado por:
FEDER [DPI2017-83068-P]; Spanish Ministry of Science, Innovation and Universities
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