Femtosecond Laser Ablation Inductively Coupled Plasma Mass Spectrometry: Fundamentals and Capabilities for Depth Profiling Analysis

dc.contributor.author	Pisonero Castro, Jorge
dc.contributor.author	Guenther, Detlef
dc.date.accessioned	2013-01-30T10:03:30Z
dc.date.available	2013-01-30T10:03:30Z
dc.date.issued	2008
dc.identifier.citation	Mass Spectrometry Reviews, 27(6), p. 609-623 (2008); doi:10.1002/mas.20180	spa
dc.identifier.issn	0277-7037
dc.identifier.uri	http://hdl.handle.net/10651/7533
dc.format.extent	p. 609-623	spa
dc.language.iso	eng
dc.relation.ispartof	Mass Spectrometry Reviews	spa
dc.rights	(c) Mass Spectrometry Reviews
dc.source	WOK	spa
dc.title	Femtosecond Laser Ablation Inductively Coupled Plasma Mass Spectrometry: Fundamentals and Capabilities for Depth Profiling Analysis	spa
dc.type	journal article
dc.identifier.local	411	spa
dc.identifier.doi	10.1002/mas.20180
dc.relation.publisherversion	http://dx.doi.org/10.1002/mas.20180	spa

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