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Simulation of laser profilometer measurements in the presence of speckle using perlin noise

dc.contributor.authorRoos-Hoefgeest, S.
dc.contributor.authorRoos-Hoefgeest, M.
dc.contributor.authorÁlvarez García, Ignacio 
dc.contributor.authorGonzález de Los Reyes, Rafael Corsino
dc.date.accessioned2024-04-18T07:21:28Z
dc.date.available2024-04-18T07:21:28Z
dc.date.issued2023
dc.identifier.citationSensors, 23(17), (2023); doi:10.3390/s23177624
dc.identifier.issn1424-8220
dc.identifier.urihttps://hdl.handle.net/10651/72275
dc.description.sponsorshipThis research was funded by the Severo Ochoa Program for predoctoral research and teaching with Ref: PA-20-PF-BP19-067, from the Asturias Regional Government.
dc.language.isoeng
dc.relation.ispartofSensors
dc.rights©,
dc.sourceScopus
dc.source.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-85170347650&doi=10.3390%2fs23177624&partnerID=40&md5=49a71cbfe2bbca2d70b68ab0c4e81d80
dc.titleSimulation of laser profilometer measurements in the presence of speckle using perlin noise
dc.typejournal article
dc.identifier.doi10.3390/s23177624
dc.relation.publisherversionhttp://dx.doi.org/10.3390/s23177624


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