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A scaling limit for line and surface defects

dc.contributor.authorRodríguez Gómez, Diego 
dc.date.accessioned2022-11-08T12:42:26Z
dc.date.available2022-11-08T12:42:26Z
dc.date.issued2022
dc.identifier.citationJournal of High Energy Physics, 2022(6) (2022); doi:10.1007/JHEP06(2022)071
dc.identifier.issn1029-8479
dc.identifier.urihttp://hdl.handle.net/10651/65314
dc.description.statementofresponsibilityThis work is partly supported by Spanish national grant MINECO-16-FPA2015-63667-P as well as the Principado de Asturias (Spain) grant SV-PA-21-AYUD/2021/52177.
dc.language.isoeng
dc.relation.ispartofJournal of High Energy Physics
dc.rights© El autor
dc.rightsCC Reconocimiento 4.0 Internacional
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/
dc.sourceScopus
dc.source.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-85131784983&doi=10.1007%2fJHEP06%282022%29071&partnerID=40&md5=391719729be368c58b830f5b5adb04fd
dc.titleA scaling limit for line and surface defects
dc.typejournal article
dc.identifier.doi10.1007/JHEP06(2022)071
dc.relation.projectIDMINECO-16-FPA2015-63667-P
dc.relation.projectIDSV-PA-21-AYUD/2021/52177
dc.relation.publisherversionhttp://dx.doi.org/10.1007/JHEP06(2022)071
dc.rights.accessRightsopen access
dc.type.hasVersionVoR


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