Defect detection based on monogenic signal processing

dc.contributor.author	Fleuret, J.
dc.contributor.author	Ibarra Castanedo, C.
dc.contributor.author	Lei, L.
dc.contributor.author	Sfarra, S.
dc.contributor.author	Usamentiaga Fernández, Rubén
dc.contributor.author	Maldague, X.
dc.date.accessioned	2020-01-23T08:17:29Z
dc.date.available	2020-01-23T08:17:29Z
dc.date.issued	2019
dc.identifier.isbn	9781510626379
dc.identifier.issn	0277-786X
dc.identifier.uri	http://hdl.handle.net/10651/53722
dc.description	Algorithms, Technologies, and Applications for Multispectral and Hyperspectral Imagery (25th. 2019. Baltimore)
dc.description.sponsorship	This research was supported by the Fond Quebecois de Recherche - Nature et Technologie (FQRNT). The author would like to thank Annette Schwerdtfeger for the time and energy she spent reviewing this article.
dc.format.extent	p. 109861X-
dc.language.iso	eng
dc.relation.ispartof	Proceedings of SPIE - The International Society for Optical Engineering
dc.rights	© Society of Photo-Optical Instrumentation Engineers (SPIE)
dc.source	Scopus
dc.source.uri	https://www.scopus.com/inward/record.uri?eid=2-s2.0-85072580665&doi=10.1117%2f12.2519087&partnerID=40&md5=021cee04109699aaa52da7abf479ce93
dc.title	Defect detection based on monogenic signal processing
dc.type	conference output	spa
dc.identifier.doi	10.1117/12.2519087
dc.relation.publisherversion	http://dx.doi.org/10.1117/12.2519087

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