Depth profile analysis with glow discharge spectrometry

dc.contributor.author	Lobo Revilla, Lara
dc.contributor.author	Fernández García, Beatriz
dc.contributor.author	Pereiro García, María Rosario
dc.date.accessioned	2017-10-31T10:48:10Z
dc.date.available	2017-10-31T10:48:10Z
dc.date.issued	2017
dc.identifier.citation	Journal of Analytical Atomic Spectrometry, 32(5), p. 920-930 (2017); doi:10.1039/c7ja00055c
dc.identifier.issn	0267-9477
dc.identifier.issn	1364-5544
dc.identifier.uri	http://hdl.handle.net/10651/44058
dc.description.sponsorship	Lara Lobo acknowledges financial support through program Juan de la Cierva-Incorporación (IJCI-2015-25801) and Beatriz Fernández acknowledges her research contract RYC-2014-14985 through the Ramón y Cajal Program, both from the Spanish Ministry of Economy and Competitiveness
dc.format.extent	p. 920-930
dc.language.iso	eng
dc.relation.ispartof	Journal of Analytical Atomic Spectrometry
dc.rights	©,
dc.source	WOS:000401119500003
dc.title	Depth profile analysis with glow discharge spectrometry
dc.type	journal article
dc.identifier.doi	10.1039/c7ja00055c
dc.relation.projectID	Ramón y Cajal Program from the Spanish Ministry of Economy and Competitiveness/RYC-2014-14985
dc.relation.projectID	MINECO/IJCI-2015-25801
dc.relation.publisherversion	http://dx.doi.org/10.1039/c7ja00055c

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