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Depth profile analysis with glow discharge spectrometry

dc.contributor.authorLobo Revilla, Lara 
dc.contributor.authorFernández García, Beatriz 
dc.contributor.authorPereiro García, María Rosario 
dc.date.accessioned2017-10-31T10:48:10Z
dc.date.available2017-10-31T10:48:10Z
dc.date.issued2017
dc.identifier.citationJournal of Analytical Atomic Spectrometry, 32(5), p. 920-930 (2017); doi:10.1039/c7ja00055c
dc.identifier.issn0267-9477
dc.identifier.issn1364-5544
dc.identifier.urihttp://hdl.handle.net/10651/44058
dc.description.sponsorshipLara Lobo acknowledges financial support through program Juan de la Cierva-Incorporación (IJCI-2015-25801) and Beatriz Fernández acknowledges her research contract RYC-2014-14985 through the Ramón y Cajal Program, both from the Spanish Ministry of Economy and Competitiveness
dc.format.extentp. 920-930
dc.language.isoeng
dc.relation.ispartofJournal of Analytical Atomic Spectrometry
dc.rights©,
dc.sourceWOS:000401119500003
dc.titleDepth profile analysis with glow discharge spectrometry
dc.typejournal article
dc.identifier.doi10.1039/c7ja00055c
dc.relation.projectIDRamón y Cajal Program from the Spanish Ministry of Economy and Competitiveness/RYC-2014-14985
dc.relation.projectIDMINECO/IJCI-2015-25801
dc.relation.publisherversionhttp://dx.doi.org/10.1039/c7ja00055c


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