Ray-tracing techniques applied to the accessibility analysis for the automatic contact and non contact inspection

dc.contributor.author	Álvarez Álvarez, Braulio José
dc.contributor.author	Fernández, P.
dc.contributor.author	Rico Fernández, José Carlos
dc.contributor.author	Valiño Riestra, Gonzalo
dc.date.accessioned	2016-03-14T16:52:15Z
dc.date.available	2016-03-14T16:52:15Z
dc.date.issued	2009
dc.identifier.citation	Advances in Electrical Engineering and Computational Science, p. 459-469 (2009); doi:10.1007/978-90-481-2311-7_39
dc.identifier.isbn	9789048123100
dc.identifier.issn	1876-1100
dc.identifier.uri	http://www.scopus.com/inward/record.url?eid=2-s2.0-78651581319&partnerID=40&md5=80a6cc42343630372e38d88921ec3b7b
dc.identifier.uri	http://hdl.handle.net/10651/35368
dc.format.extent	p. 459-469
dc.language.iso	eng
dc.relation.ispartof	Advances in Electrical Engineering and Computational Science
dc.relation.ispartofseries	Lecture notes in Electrical Engineering;39
dc.rights	©,
dc.source	Scopus
dc.title	Ray-tracing techniques applied to the accessibility analysis for the automatic contact and non contact inspection
dc.type	book part	spa
dc.identifier.doi	10.1007/978-90-481-2311-7_39
dc.relation.publisherversion	http://dx.doi.org/10.1007/978-90-481-2311-7_39

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