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Development of a behaviour curve for quality evaluation with optoelectronic profilometers
dc.contributor.author | Cuesta González, Eduardo | |
dc.contributor.author | González Madruga, Daniel | |
dc.contributor.author | Álvarez Álvarez, Braulio José | |
dc.contributor.author | García Diéguez, Marta | |
dc.date.accessioned | 2015-07-03T08:40:34Z | |
dc.date.available | 2015-07-03T08:40:34Z | |
dc.date.issued | 2014 | |
dc.identifier.citation | Key Engineering Materials, 615, p. 51-56 (2014) | |
dc.identifier.issn | 1662-9795 | |
dc.identifier.uri | http://hdl.handle.net/10651/31521 | |
dc.format.extent | p. 51-56 | spa |
dc.language.iso | eng | spa |
dc.publisher | Trans Tech | |
dc.relation.ispartof | Key Engineering Materials, 615 | spa |
dc.title | Development of a behaviour curve for quality evaluation with optoelectronic profilometers | spa |
dc.type | journal article |
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