dc.contributor.author | Castillo Ron, Enrique | |
dc.contributor.author | Hadi, Ali S. | |
dc.contributor.author | Conejo, Antonio | |
dc.contributor.author | Fernández Canteli, Alfonso Carlos | |
dc.date.accessioned | 2015-03-25T11:19:53Z | |
dc.date.available | 2015-03-25T11:19:53Z | |
dc.date.issued | 2004 | |
dc.identifier.citation | Technometrics, 46(4), p. 430-444 (2004); doi:10.1198/004017004000000509 | |
dc.identifier.issn | 0040-1706 | |
dc.identifier.issn | 1537-2723 | |
dc.identifier.uri | http://hdl.handle.net/10651/30524 | |
dc.format.extent | p. 430-444 | spa |
dc.language.iso | eng | spa |
dc.publisher | Taylor & Francis | |
dc.relation.ispartof | Technometrics, 46(4) | spa |
dc.title | A general method for local sensitivity analysis with application to regression models and other Optimization Problems | eng |
dc.type | journal article | |
dc.identifier.doi | 10.1198/004017004000000509 | |
dc.relation.publisherversion | http://dx.doi.org/10.1198/004017004000000509 | |