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Capabilities and limitations of LA-ICP-MS for depth resolved analysis of CdTe photovoltaic devices

dc.contributor.authorGutiérrez González, Ana 
dc.contributor.authorGonzález Gago, Cristina 
dc.contributor.authorPisonero Castro, Jorge 
dc.contributor.authorTibbetts, Nicole J.
dc.contributor.authorMenéndez, A.
dc.contributor.authorVélez Fraga, María 
dc.contributor.authorBordel García, Nerea 
dc.date.accessioned2015-03-20T12:41:04Z
dc.date.available2015-03-20T12:41:04Z
dc.date.issued2015
dc.identifier.citationJournal of Analytical Atomic Spectrometry, 30(1), p. 191-197 (2015); doi:10.1039/c4ja00196f
dc.identifier.issn0267-9477
dc.identifier.urihttp://hdl.handle.net/10651/30269
dc.format.extentp. 191-197
dc.language.isoeng
dc.relation.ispartofJournal of Analytical Atomic Spectrometry
dc.rights©,
dc.sourceScopus
dc.source.urihttp://www.scopus.com/inward/record.url?eid=2-s2.0-84917691504&partnerID=40&md5=07486bf6420d455780954fd56517d906
dc.titleCapabilities and limitations of LA-ICP-MS for depth resolved analysis of CdTe photovoltaic devices
dc.typeinfo:eu-repo/semantics/article
dc.identifier.doi10.1039/c4ja00196f
dc.type.dcmitext
dc.relation.publisherversionhttp://dx.doi.org/10.1039/c4ja00196f


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