Capabilities and limitations of LA-ICP-MS for depth resolved analysis of CdTe photovoltaic devices

dc.contributor.author	Gutiérrez González, Ana
dc.contributor.author	González Gago, Cristina
dc.contributor.author	Pisonero Castro, Jorge
dc.contributor.author	Tibbetts, Nicole J.
dc.contributor.author	Menéndez, A.
dc.contributor.author	Vélez Fraga, María
dc.contributor.author	Bordel García, Nerea
dc.date.accessioned	2015-03-20T12:41:04Z
dc.date.available	2015-03-20T12:41:04Z
dc.date.issued	2015
dc.identifier.citation	Journal of Analytical Atomic Spectrometry, 30(1), p. 191-197 (2015); doi:10.1039/c4ja00196f
dc.identifier.issn	0267-9477
dc.identifier.uri	http://hdl.handle.net/10651/30269
dc.format.extent	p. 191-197
dc.language.iso	eng
dc.relation.ispartof	Journal of Analytical Atomic Spectrometry
dc.rights	©,
dc.source	Scopus
dc.source.uri	http://www.scopus.com/inward/record.url?eid=2-s2.0-84917691504&partnerID=40&md5=07486bf6420d455780954fd56517d906
dc.title	Capabilities and limitations of LA-ICP-MS for depth resolved analysis of CdTe photovoltaic devices
dc.type	journal article
dc.identifier.doi	10.1039/c4ja00196f
dc.relation.publisherversion	http://dx.doi.org/10.1039/c4ja00196f

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