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Material characterization using a millimeter wave portal-based imaging system for security screening

dc.contributor.authorÁlvarez López, Yuri 
dc.contributor.authorLas Heras Andrés, Fernando Luis 
dc.contributor.authorGonzález Valdés, Borja
dc.contributor.authorMartínez Lorenzo, José Ángel 
dc.contributor.authorRappaport, Carey M.
dc.date.accessioned2014-04-04T08:14:35Z
dc.date.available2014-04-04T08:14:35Z
dc.date.issued2013
dc.identifier.urihttp://ieeexplore.ieee.org/ielx7/6691968/6698956/06699056.pdf?tp=&arnumber=6699056&isnumber=6698956
dc.identifier.urihttp://hdl.handle.net/10651/25275
dc.description.sponsorshipThis work is supported by CenSSIS, the Gordon Center for Subsurface Sensing and Imaging Systems NSF ERC Program (Award number EEC-9986821); by the “Ministerio de Ciencia e Innovación” of Spain/FEDER under projects CONSOLIDER-INGENIO CSD2008-00068 (TERASENSE), and TEC2011-24492/TEC (iSCAT). This material is based upon work supported by the Science and Tech. Directorate, U.S. Department of Homeland Security under the Award Number “2008-ST-061-ED0001”.
dc.format.extentp. 511-516
dc.language.isoeng
dc.relation.ispartof2013 IEEE INTERNATIONAL CONFERENCE ON TECHNOLOGIES FOR HOMELAND SECURITY (HST)
dc.rights©,
dc.sourceWOS:000330768500085
dc.titleMaterial characterization using a millimeter wave portal-based imaging system for security screening
dc.typeconference outputspa
dc.identifier.local20141136


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