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Toward extended range sub-micron Conoscopic Holography profilometers, using multiple wavelengths and phase measurement

dc.contributor.authorEnguita González, José María spa
dc.contributor.authorÁlvarez García, Ignacio spa
dc.contributor.authorMarina Juárez, Jorge spa
dc.contributor.authorOjea Merín, Guillermo spa
dc.contributor.authorCancelas Caso, José Antonio spa
dc.contributor.authorFrade Rodríguez, María spa
dc.date.accessioned2013-01-30T12:36:30Z
dc.date.available2013-01-30T12:36:30Z
dc.date.issued2009spa
dc.identifier.issn0277-786Xspa
dc.identifier.urihttp://www.scopus.com/inward/record.url?eid=2-s2.0-70350004231&partnerID=40spa
dc.identifier.urihttp://hdl.handle.net/10651/11950
dc.language.isoeng
dc.relation.ispartofProceedings of SPIE - The International Society for Optical Engineeringspa
dc.sourceSCOPUSspa
dc.titleToward extended range sub-micron Conoscopic Holography profilometers, using multiple wavelengths and phase measurementspa
dc.typeconference outputspa
dc.identifier.local20090215spa
dc.identifier.doi10.1117/12.819456spa
dc.relation.publisherversionhttp://dx.doi.org/10.1117/12.819456spa


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