Monitoring industrial processes with SOM-based dissimilarity maps

dc.contributor.author	Domínguez González, Manuel
dc.contributor.author	Fuertes Martínez, Juan José
dc.contributor.author	Díaz Blanco, Ignacio
dc.contributor.author	Prada Medrano, Miguel Ángel
dc.contributor.author	Alonso Castro, Serafín
dc.contributor.author	Morán Álvarez, Antonio
dc.date.accessioned	2013-01-30T10:08:06Z
dc.date.available	2013-01-30T10:08:06Z
dc.date.issued	2012
dc.identifier.citation	Expert Systems with Applications, 39(8), p. 7110-7120 (2012); doi:10.1016/j.eswa.2012.01.033	spa
dc.identifier.issn	0957-4174
dc.identifier.uri	http://hdl.handle.net/10651/8457
dc.format.extent	p. 7110-7120	spa
dc.language.iso	eng
dc.relation.ispartof	Expert Systems with Applications	spa
dc.source	SCOPUS	spa
dc.title	Monitoring industrial processes with SOM-based dissimilarity maps	spa
dc.type	journal article
dc.identifier.local	20120323	spa
dc.identifier.doi	10.1016/j.eswa.2012.01.033
dc.relation.publisherversion	http://dx.doi.org/10.1016/j.eswa.2012.01.033	spa

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