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Decoupling effects for dynamic switching stress in sic mosfets

Author:
Gómez Gómez, Alexis AnselmoUniovi authority; García Meré, Juan RamónUniovi authority; Rodríguez Alonso, AlbertoUniovi authority; Rodríguez Méndez, JuanUniovi authority; Jiménez Guerra, C.; Roig Guitart, J.
Publication date:
2025
Publisher version:
http://dx.doi.org/10.1109/TIA.2025.3534183
Citación:
IEEe Transactions on Industry Applications (2025); doi:10.1109/TIA.2025.3534183
URI:
https://hdl.handle.net/10651/78446
ISSN:
0093-9994
DOI:
10.1109/TIA.2025.3534183
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