Repositorio Institucional de la Universidad de Oviedo
View Item
RUO Home
Producción Bibliográfica de UniOvi: RECOPILA
Artículos
View Item
RUO Home
Producción Bibliográfica de UniOvi: RECOPILA
Artículos
View Item
Toggle navigation
español
English
JavaScript is disabled for your browser. Some features of this site may not work without it.
Search RUO
This Collection
Browse
All of RUO
Communities and Collections
By Issue Date
Authors
Titles
Subjects
xmlui.ArtifactBrowser.Navigation.browse_issn
Author profiles
This Collection
By Issue Date
Authors
Titles
Subjects
xmlui.ArtifactBrowser.Navigation.browse_issn
My Account
Login
Register
Statistics
View Usage Statistics
RECENTLY ADDED
Last submissions
Repository
How to publish
Resources
FAQs
Decoupling effects for dynamic switching stress in sic mosfets
Author:
Gómez Gómez, Alexis Anselmo
;
García Meré, Juan Ramón
;
Rodríguez Alonso, Alberto
;
Rodríguez Méndez, Juan
;
Jiménez Guerra, C.
;
Roig Guitart, J.
Publication date:
2025
Publisher version:
http://dx.doi.org/10.1109/TIA.2025.3534183
Citación:
IEEe Transactions on Industry Applications (2025); doi:10.1109/TIA.2025.3534183
URI:
https://hdl.handle.net/10651/78446
ISSN:
0093-9994
DOI:
10.1109/TIA.2025.3534183
Collections
Artículos
[37321]
Files in this item
Métricas
Compartir
Estadísticas de uso
Estadísticas de uso
Metadata
Show full item record