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Layer contour verification in additive manufacturing by means of commercial flatbed scanners
dc.contributor.author | Blanco Fernández, David | |
dc.contributor.author | Fernández Álvarez, Pedro | |
dc.contributor.author | Noriega González, Álvaro | |
dc.contributor.author | Álvarez Álvarez, Braulio José | |
dc.contributor.author | Valiño Riestra, Gonzalo | |
dc.date.accessioned | 2020-06-26T07:57:10Z | |
dc.date.available | 2020-06-26T07:57:10Z | |
dc.date.issued | 2020 | |
dc.identifier.citation | Sensors (Switzerland), 20(1), p. 1- (2020); doi:10.3390/s20010001 | |
dc.identifier.issn | 1424-8220 | |
dc.identifier.uri | http://hdl.handle.net/10651/55268 | |
dc.description.sponsorship | This work was supported by the Spanish Ministry of Science, Innovation and Universities and by FEDER (DPI2017-83068-P). | |
dc.format.extent | p. 1- | |
dc.language.iso | eng | |
dc.relation.ispartof | Sensors (Switzerland), 20 | |
dc.rights | © 2020 Blanco Fernández et al. | |
dc.rights | CC Reconocimiento 4.0 Internacional 4.0 | |
dc.rights.uri | http://creativecommons.org/licenses/by/4.0/ | |
dc.source | Scopus | |
dc.source.uri | https://www.scopus.com/inward/record.uri?eid=2-s2.0-85076997753&doi=10.3390%2fs20010001&partnerID=40&md5=9bc38b3eed16d7d0edd0197e1aa0d7a9 | |
dc.title | Layer contour verification in additive manufacturing by means of commercial flatbed scanners | |
dc.type | journal article | |
dc.identifier.doi | 10.3390/s20010001 | |
dc.relation.projectID | MICIU/FEDER/DPI2017-83068-P | |
dc.relation.publisherversion | http://dx.doi.org/10.3390/s20010001 | |
dc.rights.accessRights | open access | |
dc.type.hasVersion | VoR |
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