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Layer contour verification in additive manufacturing by means of commercial flatbed scanners

dc.contributor.authorBlanco Fernández, David 
dc.contributor.authorFernández Álvarez, Pedro 
dc.contributor.authorNoriega González, Álvaro 
dc.contributor.authorÁlvarez Álvarez, Braulio José 
dc.contributor.authorValiño Riestra, Gonzalo 
dc.date.accessioned2020-06-26T07:57:10Z
dc.date.available2020-06-26T07:57:10Z
dc.date.issued2020
dc.identifier.citationSensors (Switzerland), 20(1), p. 1- (2020); doi:10.3390/s20010001
dc.identifier.issn1424-8220
dc.identifier.urihttp://hdl.handle.net/10651/55268
dc.description.sponsorshipThis work was supported by the Spanish Ministry of Science, Innovation and Universities and by FEDER (DPI2017-83068-P).
dc.format.extentp. 1-
dc.language.isoeng
dc.relation.ispartofSensors (Switzerland), 20
dc.rights© 2020 Blanco Fernández et al.
dc.rightsCC Reconocimiento 4.0 Internacional 4.0
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/
dc.sourceScopus
dc.source.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-85076997753&doi=10.3390%2fs20010001&partnerID=40&md5=9bc38b3eed16d7d0edd0197e1aa0d7a9
dc.titleLayer contour verification in additive manufacturing by means of commercial flatbed scanners
dc.typejournal article
dc.identifier.doi10.3390/s20010001
dc.relation.projectIDMICIU/FEDER/DPI2017-83068-P
dc.relation.publisherversionhttp://dx.doi.org/10.3390/s20010001
dc.rights.accessRightsopen access
dc.type.hasVersionVoR


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