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Depth Profile Analysis of Amorphous Silicon Thin Film Solar Cells by Pulsed Radiofrequency Glow Discharge Time of Flight Mass Spectrometry
dc.contributor.author | Álvarez Toral, Aitor | |
dc.contributor.author | Sánchez, Pascal | |
dc.contributor.author | Menéndez, Armando | |
dc.contributor.author | Pereiro García, María Rosario | |
dc.contributor.author | Sanz Medel, Alfredo | |
dc.contributor.author | Fernández García, Beatriz | |
dc.date.accessioned | 2015-07-13T11:28:46Z | |
dc.date.available | 2015-07-13T11:28:46Z | |
dc.date.issued | 2015 | |
dc.identifier.citation | Journal of The American Society for Mass Spectrometry, 26(2), p. 305-314 (2015); doi:10.1007/s13361-014-1022-9 | |
dc.identifier.issn | 1044-0305 | |
dc.identifier.issn | 1879-1123 | |
dc.identifier.uri | http://hdl.handle.net/10651/31624 | |
dc.description.sponsorship | Spanish Ministry of Science and Innovation [MAT2010-20921-C02-01]; FEDER Program [MAT2010-20921-C02-01]; FPU [AP2010-3615] | |
dc.format.extent | p. 305-314 | |
dc.language.iso | eng | |
dc.relation.ispartof | Journal of The American Society for Mass Spectrometry | |
dc.rights | © American Society for Mass Spectrometry | |
dc.title | Depth Profile Analysis of Amorphous Silicon Thin Film Solar Cells by Pulsed Radiofrequency Glow Discharge Time of Flight Mass Spectrometry | |
dc.type | journal article | |
dc.identifier.doi | 10.1007/s13361-014-1022-9 | |
dc.relation.publisherversion | http://dx.doi.org/10.1007/s13361-014-1022-9 |
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