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A General Perspective of the Characterization and Quantification of Nanoparticles: Imaging, Spectroscopic, and Separation Techniques

dc.contributor.authorLapresta-Fernández, A.
dc.contributor.authorSalinas Castillo, Alfonso
dc.contributor.authorLlana, S. Anderson de la
dc.contributor.authorCosta Fernández, José Manuel 
dc.contributor.authorDomínguez-Meister, S.
dc.contributor.authorCecchini, Raimondo
dc.contributor.authorCapitan-Vallvey, L. F.
dc.contributor.authorMoreno-Bondi, M. C.
dc.contributor.authorMarco, M. Pilar
dc.contributor.authorSánchez López, Juan Carlos
dc.contributor.authorAnderson, I. S.
dc.date.accessioned2014-09-01T09:07:28Z
dc.date.available2014-09-01T09:07:28Z
dc.date.issued2014
dc.identifier.citationCritical Reviews In Solid State And Materials Sciences, 39(6), p. 423-458 (2014); doi:10.1080/10408436.2014.899890
dc.identifier.issn1040-8436
dc.identifier.issn1547-6561
dc.identifier.urihttp://hdl.handle.net/10651/28403
dc.format.extentp. 423-458
dc.language.isoeng
dc.relation.ispartofCritical Reviews In Solid State And Materials Sciences
dc.rights©,
dc.sourceWOS:000337908400002
dc.titleA General Perspective of the Characterization and Quantification of Nanoparticles: Imaging, Spectroscopic, and Separation Techniqueseng
dc.typejournal article
dc.identifier.local20142016
dc.identifier.doi10.1080/10408436.2014.899890
dc.relation.publisherversionhttp://dx.doi.org/10.1080/10408436.2014.899890


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