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Please use this identifier to cite or link to this item: http://hdl.handle.net/10651/9104

Title: P, S and Cl trace detection by laser ablation double-focusing sector field ICP-MS to identify local defects in coated glasses
Author(s): Konz Gherghel, Ioana
Fernández García, Beatriz
Pereiro García, María Rosario
Fernández Sánchez, María Luisa
Sanz Medel, Alfredo
Keywords: Double Focussing Spectrometer, Inductively Coupled Plasma/Ms, Trace Analysis, P, S, Cl.
Issue date: 2011
Publisher version: http://dx.doi.org/10.1039/c0ja00271b
Citation: Journal of Analytical Atomic Spectrometry, 26(7), p. 1526-1530 (2011); doi:10.1039/c0ja00271b
Format extent: p. 1526-1530
Abstract: Glass defects are always undesired because of their significant costs to manufacturing industries. Laser ablation inductively coupled plasma mass spectrometry (LA-ICP-MS) is a versatile technique for local trace element analysis in a wide variety of solid samples. Furthermore, the coupling of laser systems to double-focusing sector field mass analyzers provides low limits of detection with a high mass resolving power, allowing the accurate analysis of P, S and Cl traces in local defects of coated glasses. Three different types of defects, depending on the impurities identified at the LA-ICP-MS profiles, were found in the selected coated glasses (with metallic and oxide films in the low nanometre range), enabling the unambiguous identification of the contamination source that produces the local defects.
URI: http://hdl.handle.net/10651/9104
ISSN: 0267-9477
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