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Repositorio de la Universidad de Oviedo. > Producción Bibliográfica de UniOvi: RECOPILA > Artículos >

Please use this identifier to cite or link to this item: http://hdl.handle.net/10651/7235

Title: Depth profile characterization of Zn-TiO2 nanocomposite films by pulsed radiofrequency glow discharge-optical emission spectrometry
Author(s): Alberts, Deborah Viviane M.
Fernández García, Beatriz
Frade, Tânia
Gomes, Anabela
Pereira, María Isabel da Silva
Pereiro García, María Rosario
Sanz Medel, Alfredo
Keywords: Metal-Matrix Composites; Nanocomposites; Depth Profiling Analysis; Glow Discharge Optical Emission Spectrometry
Issue date: 2011
Publisher version: http://dx.doi.org/10.1016/j.talanta.2011.01.076
Citation: Talanta, 84(2), p. 572-578 (2011); doi:10.1016/j.talanta.2011.01.076
Format extent: p. 572-578
Abstract: In recent years particular effort is being devoted towards the development of radiofrequency (rf) pulsed glow discharges (GDs) coupled to optical emission spectrometry (OES) for depth profile analysis of materials with technological interest. In this work, pulsed rf-GD-OES is investigated for the fast and sensitive depth characterization of Zn–TiO2 nanocomposite films deposited on conductive substrates (Ti and steel). The first part of this work focuses on assessing the advantages of pulsed GDs, in comparison with the continuous GD, in terms of analytical emission intensities and emission yields. Next, the capability of pulsed rf-GD-OES for determination of thickness and compositional depth profiles is demonstrated by resorting to a simple multi-matrix calibration procedure. A rf forward power of 75 W, a pressure of 600 Pa, 10 kHz pulse frequency and 50% duty cycle were selected as GD operation parameters.Quantitative depth profiles obtained with the GD proposed methodology for Zn–TiO2 nanocomposite films, prepared by the occlusion electrodeposition method using pulsed reverse current electrolysis, have proved to be in good agreement with results achieved by complementary techniques, including scanning electron microscopy and inductively coupled plasma-mass spectrometry. The work carried out demonstrates that pulsed rf-GD-OES is a promising tool for the fast analytical characterization of nanocomposite films.
URI: http://hdl.handle.net/10651/7235
ISSN: 0039-9140
Local identifier: 20110326
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